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Showing items 1 - 2 of 2

1displacement measurements 1high-speed AFMs 1piezoelectric devices 1piezoelectric tube scanners 1piezoelectricity 1scanning 1scanning systems

1Moheimani, S. O. R. 1Moheimani, S. O. Reza

1conference paper 1journal article

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1displacement measurements 1high-speed AFMs 1piezoelectric devices 1piezoelectric tube scanners 1piezoelectricity 1scanning 1scanning systems

1Moheimani, S. O. R. 1Moheimani, S. O. Reza

1conference paper 1journal article

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A 12-electrode piezoelectric tube scanner for fast atomic force microscopy

- Yong, Yuen K., Ahmed, Bilal, Moheimani, S. O. R.

Creator: Yong, Yuen K. , Ahmed, Bilal , Moheimani, S. O. R.
Resource Type: conference paper
Date: 2010

A 12-electrode piezoelectric tube scanner for fast atomic force microscopy

Creator: Yong, Yuen K. , Ahmed, Bilal , Moheimani, S. O. R.
Resource Type: conference paper
Date: 2010

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Atomic force microscopy with a 12-electrode piezoelectric tube scanner

- Yong, Yuen K., Ahmed, Bilal, Moheimani, S. O. Reza

Creator: Yong, Yuen K. , Ahmed, Bilal , Moheimani, S. O. Reza
Resource Type: journal article
Date: 2010

Atomic force microscopy with a 12-electrode piezoelectric tube scanner

Creator: Yong, Yuen K. , Ahmed, Bilal , Moheimani, S. O. Reza
Resource Type: journal article
Date: 2010

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